Speaker
Description
A SCRIT (Self-Confining RI Ion Target) method is a target-forming technique in an electron storage ring for electron scattering experiments with unstable nuclei. A target ion beam with a charge state of 1+ is injected into a SCRIT device. They are trapped transversely by periodic focusing forces from electron beam bunches and longitudinally by the electrostatic well-potential in the SCRIT device. The time evolution of luminosity during the ion trapping is monitored by the luminosity monitor. After ion trapping in the SCRIT device, the target ions are extracted and transported to the ion analyzer. The time evolutions of the trapped charge and charge state distributions were measured by the ion analyzer. Currently, the target ions trapped in the SCRIT contribute only 10–20% to the electron scattering. To improve the contribution ratio, optimizing the SCRIT performance is necessary. In this presentation, we report and discuss the target performance depending on the electron beam conditions for the target optimization.